The TPD1E01B04-Q1 is a bidirectional TVS ESD protection diode for USB Type-C and FPD-Link circuit protection. The TPD1E01B04-Q1 is rated to dissipate ESD strikes at the maximum level specified in the IEC 61000-4-2 international standard (Level 4).
This device features a 0.20-pF (typical) IO capacitance making it ideal for protecting high-speed interfaces up to 20 Gbps such as USB 3.1 Gen2 and FPD-Link. The low dynamic resistance and low clamping voltage ensure system level protection against transient events.
The TPD1E01B04-Q1 is offered in the industry standard 0402 (DPY) package.
PART NUMBER | PACKAGE | BODY SIZE (NOM) |
---|---|---|
TPD1E01B04-Q1 | X1SON (2) | 1.00 mm x 0.60 mm |
Changes from Revision * (May 2021) to Revision A (December 2021)
PIN | TYPE(1) | DESCRIPTION | |
---|---|---|---|
NO. | NAME | ||
1 | IO | I/O | ESD Protected Channel. If used as ESD IO, connect pin 2 to ground |
2 | IO | I/O | ESD Protected Channel. If used as ESD IO, connect pin 1 to ground |
MIN | MAX | UNIT | ||
---|---|---|---|---|
Electrical fast transient | IEC 61000-4-5 (5/50 ns) at 25°C | 80 | A | |
Peak pulse | IEC 61000-4-5 power (tp - 8/20 µs) at 25°C | 27 | W | |
IEC 61000-4-5 current (tp - 8/20 µs) at 25°C | 2.5 | A | ||
TA | Operating free-air temperature | –40 | 125 | °C |
Tstg | Storage temperature | –65 | 155 | °C |
VALUE | UNIT | |||
---|---|---|---|---|
V(ESD) | Electrostatic discharge | Human body model (HBM), per AEC Q101-001 | ±2500 | V |
Charged device model (CDM), per AEC Q101-005 | ±1000 |
VALUE | UNIT | |||
---|---|---|---|---|
V(ESD) | Electrostatic discharge | IEC 61000-4-2 Contact Discharge, all pins | ±15000 | V |
IEC 61000-4-2 Air-gap Discharge, all pins | ±17000 |
VALUE | UNIT | ||||
---|---|---|---|---|---|
V(ESD) | Electrostatic discharge | ISO 10605, 330-pF, 330-Ω, IO | Contact discharge | ± 12500 | V |
Air-gap discharge | ±15000 |
MIN | NOM | MAX | UNIT | ||
---|---|---|---|---|---|
VIO | Input pin voltage | –3.6 | 3.6 | V | |
TA | Operating free-air temperature | –40 | 125 | °C |
THERMAL METRIC(1) | TPD1E01B04-Q1 | UNIT | |
---|---|---|---|
DPY (X1SON) | |||
2 PINS | |||
RθJA | Junction-to-ambient thermal resistance | 442.6 | °C/W |
RθJC(top) | Junction-to-case (top) thermal resistance | 243.8 | °C/W |
RθJB | Junction-to-board thermal resistance | 162.5 | °C/W |
ΨJT | Junction-to-top characterization parameter | 154.1 | °C/W |
ΨJB | Junction-to-board characterization parameter | 163.0 | °C/W |
RθJC(bot) | Junction-to-case (bottom) thermal resistance | n/a | °C/W |
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | ||
---|---|---|---|---|---|---|---|
VRWM | Reverse stand-off voltage | IIO < 10 nA | –3.6 | 3.6 | V | ||
VBRF | Breakdown voltage, IO pin to GND | Measured as the maximum voltage before device snaps back into VHOLD voltage | 6.4 | V | |||
VBRR | Breakdown voltage, GND to IO pin | –6.4 | V | ||||
VHOLD | Holding voltage | IIO = 1 mA, TA = 25°C | 5 | 5.9 | 6.5 | V | |
VCLAMP | Clamping voltage | IPP = 1 A, TLP, from IO to GND | 7 | V | |||
IPP = 5 A, TLP, from IO to GND | 9.2 | ||||||
IPP = 16 A, TLP, from IO to GND | 15 | ||||||
IPP = 1 A, TLP, from GND to IO | 7 | ||||||
IPP = 5 A, TLP, from GND to IO | 9.2 | ||||||
IPP = 16 A, TLP, from GND to IO | 15 | ||||||
ILEAK | Leakage current, IO to GND | VIO = ±2.5 V | 10 | nA | |||
RDYN | Dynamic resistance | IO to GND | 0.57 | Ω | |||
GND to IO | 0.57 | ||||||
CL | Line capacitance | VIO = 0 V, f = 1 MHz, IO to GND, TA = 25°C | 0.2 | 0.23 | pF |
The TPD1E01B04-Q1 device is a bidirectional ESD Protection Diode with ultra-low capacitance. This device can dissipate ESD strikes above the maximum level specified by the IEC 61000-4-2 International Standard. The ultra-low capacitance makes this device ideal for protecting any super high-speed signal pins including Thunderbolt 3. The low capacitance allows for extremely low losses even at RF frequencies such as USB 3.1 Gen 2, Thunderbolt 3, or antenna applications.