Single-event latch-up (SEL),
single-event burnout (SEB) and single-event gate rupture (SEGR) immune to effective
linear energy transfer (LETEFF) of 43 MeV– cm2/mg.
Single-event transient (SET) and
single-event functional interrupt (SEFI) characterized to LETEFF of 43 MeV–
cm2/mg.
Input operating voltage range
(VIN): 1.6 to 5.5 V
Recommended continuous current
(IMAX): 1.25 A
On-resistance (RON):
116 mΩ (typ.) at VIN = 5
V
115 mΩ (typ.) at VIN = 3.3
V
133 mΩ (typ.) at VIN = 1.8
V
Output short protection (ISC):
3 A (typ.)
Low power consumption:
ON state (IQ): 8.3 µA
(typ.)
OFF state (ISD): 3 nA
(typ.)
Slow turn ON timing to limit inrush
current (tON):
tON at 5 V = 1.68 ms at
3.61 mV/μs
tON at
3.3 V = 1.51 ms at 2.91 mV/μs
tON at 1.8 V = 1.32 ms at
2.15 mV/μs
Adjustable output discharge and fall
time:
Internal QOD resistance = 9.2 Ω
(typ.) at VIN = 3.3 V
Space Enhanced Plastic (SEP)
Controlled baseline
Gold bondwire
NiPdAu lead finish
One assembly and test site
One fabrication site
Military (–55°C to 125°C) temperature
range
Extended product life cycle
Extended product-change notification
(PCN)
Product traceability
Enhance mold compound for low
outgassing
2 Applications
Space satellite power management and distribution
Radiation tolerant power tree applications
Enables switching power rails for controller
power up and power down