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TPS7H1121-SP Single-Event Effects (SEE)
SLVK174
September 2024
TPS7H1121-SP
CONTENTS
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TPS7H1121-SP Single-Event Effects (SEE)
1
TPS7H1121-SP Single-Event Effects (SEE)
Trademarks
1
Introduction
2
Single-Event Effects (SEE)
3
Device and Test Board Information
3.1
Device and Test Board Information Continued
4
Irradiation Facility and Setup
5
Depth, Range, and LETEFF Calculation
6
Test Setup and Procedures
7
Destructive Single-Event Effects (DSEE)
7.1
Single-Event Latch-up (SEL) Results
7.2
Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results
8
Single-Event Transients (SET)
9
Event Rate Calculations
10
Summary
A Total Ionizing Dose from SEE Experiments
B References
IMPORTANT NOTICE
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