This report presents the effect of neutron displacement damage (NDD) on the TPS7H1101A-SP device. The results show that all devices were fully functional and within production test limits after having been irradiated up to 5× 10¹² n/cm². A sample size of six units was exposed to radiation testing per (MIL-STD-883, Method 1017 for Neutron Irradiation). All devices used in the experiment were from lot date code 2017A and assembly lot 0002938 MMT. Electrical testing was performed at Texas Instruments before and after neutron irradiation using the production test program for 5962R1320201VXC.