This 80-mΩ, –20-V, P-Channel FemtoFET™ MOSFET is designed and optimized to minimize the footprint in many handheld and mobile applications. This technology is capable of replacing standard small signal MOSFETs while providing at least a 60% reduction in footprint size.
TA = 25°C | TYPICAL VALUE | UNIT | ||
---|---|---|---|---|
VDS | Drain-to-source voltage | –20 | V | |
Qg | Gate charge total (–4.5 V) | 1090 | pC | |
Qgd | Gate charge gate-to-drain | 150 | pC | |
RDS(on) | Drain-to-source
on-resistance | VGS = –1.8 V | 405 | mΩ |
VGS = –2.5 V | 150 | |||
VGS = –4.5 V | 93 | |||
VGS = –8.0 V | 80 | |||
VGS(th) | Threshold voltage | –0.95 | V |
DEVICE | QTY | MEDIA | PACKAGE(1) | SHIP |
---|---|---|---|---|
CSD25484F4 | 3000 | 7-Inch Reel | Femto (0402) 1.00-mm × 0.60-mm Land Grid Array (LGA) | Tape and Reel |
CSD25484F4T | 250 |
TA = 25°C | VALUE | UNIT | |
---|---|---|---|
VDS | Drain-to-source voltage | –20 | V |
VGS | Gate-to-source voltage | –12 | V |
ID | Continuous drain current(1) | –2.5 | A |
IDM | Pulsed drain current(1)(2) | –22 | A |
IG | Continuous gate clamp current | –35 | mA |
Pulsed gate clamp current(2) | –350 | ||
PD | Power dissipation(1) | 500 | mW |
V(ESD) | Human-body model (HBM) | 4 | kV |
Charged-device model (CDM) | 2 | ||
TJ, Tstg | Operating junction, storage temperature | –55 to 150 | °C |
Changes from Revision A (August 2017) to Revision B (February 2022)
Changes from Revision * (May 2015) to Revision A (August 2017)
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | ||
---|---|---|---|---|---|---|---|
STATIC CHARACTERISTICS | |||||||
BVDSS | Drain-to-source voltage | VGS = 0 V, IDS = –250 μA | –20 | V | |||
IDSS | Drain-to-source leakage current | VGS = 0 V, VDS = –16 V | –100 | nA | |||
IGSS | Gate-to-source leakage current | VDS = 0 V, VGS = –12 V | –50 | nA | |||
VGS(th) | Gate-to-source threshold voltage | VDS = VGS, IDS = –250 μA | –0.7 | –0.95 | –1.2 | V | |
RDS(on) | Drain-to-source on-resistance | VGS = –1.8 V, IDS = –0.1 A | 405 | 825 | mΩ | ||
VGS = –2.5 V, IDS = –0.5 A | 150 | 180 | |||||
VGS = –4.5 V, IDS = –0.5 A | 93 | 109 | |||||
VGS = –8 V, IDS = –0.5 A | 80 | 94 | |||||
gfs | Transconductance | VDS = –10 V, IDS = –0.5 A | 3.5 | S | |||
DYNAMIC CHARACTERISTICS | |||||||
Ciss | Input capacitance | VGS = 0 V, VDS = –10 V, ƒ = 1 MHz | 175 | 230 | pF | ||
Coss | Output capacitance | 78 | 102 | pF | |||
Crss | Reverse transfer capacitance | 5.5 | 7.2 | pF | |||
RG | Series gate resistance | 20 | Ω | ||||
Qg | Gate charge total (–4.5 V) | VDS = –10 V, IDS = –0.5 A | 1090 | 1415 | pC | ||
Qgd | Gate charge gate-to-drain | 150 | pC | ||||
Qgs | Gate charge gate-to-source | 350 | pC | ||||
Qg(th) | Gate charge at Vth | 210 | pC | ||||
Qoss | Output charge | VDS = –10 V, VGS = 0 V | 1290 | pC | |||
td(on) | Turnon delay time | VDS = –10 V, VGS = –4.5 V, IDS = –0.5 A, RG = 10 Ω | 9.5 | ns | |||
tr | Rise time | 5 | ns | ||||
td(off) | Turnoff delay time | 18 | ns | ||||
tf | Fall Time | 8.5 | ns | ||||
DIODE CHARACTERISTICS | |||||||
VSD | Diode forward voltage | ISD = –0.5 A, VGS = 0 V | –0.75 | V | |||
Qrr | Reverse recovery charge | VDS= –10 V, IF = –0.5 A, di/dt = 100 A/μs | 970 | pC | |||
trr | Reverse recovery time | 7.5 | ns |
THERMAL METRIC | TYPICAL VALUES | UNIT | |||
---|---|---|---|---|---|
RθJA | Junction-to-ambient thermal resistance(1) | 85 | °C/W | ||
Junction-to-ambient thermal resistance(2) | 245 |