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This single 2-input positive-NAND gate performs the Boolean function Y = A × B or Y = A + B in positive logic.
PART NUMBER | PACKAGE | BODY SIZE (NOM) |
---|---|---|
SN74AUP1G00DBV | SOT-23 (5) | 2.90 mm × 1.60 mm |
SN74AUP1G00DCK | SC70 (5) | 2.00 mm × 1.25 mm |
SN74AUP1G00DRL | SOT (5) | 1.60 mm × 1.20 mm |
SN74AUP1G00DRY | SON (6) | 1.45 mm × 1.00 mm |
SN74AUP1G00DSF | SON (6) | 1.00 mm × 1.00 mm |
SN74AUP1G00YFP | DSBGA (6) | 1.00 mm × 1.40 mm |
SN74AUP1G00YZP | DSBGA (5) | 1.37 mm × 0.87 mm |
SN74AUP1G00DPW | X2SON (5) | 0.80 mm × 0.80 mm |
Changes from I Revision (June 2014) to J Revision
Changes from H Revision (April 2012) to I Revision
Changes from G Revision (March 2010) to H Revision
PIN | I/O | DESCRIPTION | |||
---|---|---|---|---|---|
NAME | DBV, DCK, DRL |
DPW | DRY, DSF |
||
A | 1 | 2 | 1 | I | Input A |
B | 2 | 1 | 2 | I | Input B |
GND | 3 | 3 | 3 | — | Ground |
N.C. | – | – | 5 | — | No internal connection |
VCC | 5 | 5 | 6 | — | Power Pin |
Y | 4 | 4 | 4 | O | Output Y |
PIN | I/O | DESCRIPTION | ||
---|---|---|---|---|
YZP | YFP | NAME | ||
A1 | A1 | A | I | Input A |
A2 | A2 | VCC | — | Power Pin |
B1 | B1 | B | I | Input B |
– | B2 | DNU | — | Do not use |
C1 | C1 | GND | — | Ground |
C2 | C2 | Y | O | Output Y |
MIN | MAX | UNIT | |||
---|---|---|---|---|---|
VCC | Supply voltage | –0.5 | 4.6 | V | |
VI | Input voltage (2) | –0.5 | 4.6 | V | |
VO | Voltage range applied to any output in the high-impedance or power-off state(2) | –0.5 | 4.6 | V | |
VO | Output voltage range in the high or low state(2) | –0.5 | VCC + 0.5 | V | |
IIK | Input clamp current | VI < 0 | 50 | mA | |
IOK | Output clamp current | VO < 0 | 50 | mA | |
IO | Continuous output current | 20 | mA | ||
Continuous current through VCC or GND | 50 | mA | |||
TJ | Junction temperature | 150 | °C | ||
Tstg | Storage temperature | –65 | 150 | °C |
VALUE | UNIT | |||
---|---|---|---|---|
V(ESD) | Electrostatic discharge | Human body model (HBM), per ANSI/ESDA/JEDEC JS-001(1) | 2000 | V |
Charged device model (CDM), per JEDEC specification JESD22-C101(2) | 1000 |
THERMAL METRIC(1) | SN74AUP1G00 | UNIT | ||||||
---|---|---|---|---|---|---|---|---|
DBV (SOT-23) |
DCK (SC70) |
DPW (X2SON) |
DRL (SOT) |
DRY (SON) |
DSF (SON) |
|||
5 PINS | 5 PINS | 5 PINS | 5 PINS | 6 PINS | 6 PINS | |||
RθJA | Junction-to-ambient thermal resistance | 298.6 | 314.4 | 291.8 | 349.7 | 554.9 | 407.1 | °C/W |
RθJC(top) | Junction-to-case (top) thermal resistance | 240.2 | 128.7 | 224.2 | 120.5 | 385.4 | 232.0 | °C/W |
RθJB | Junction-to-board thermal resistance | 134.6 | 100.6 | 245.8 | 171.4 | 388.2 | 306.9 | °C/W |
ψJT | Junction-to-top characterization parameter | 114.5 | 7.1 | 31.4 | 10.8 | 159.0 | 40.3 | °C/W |
ψJB | Junction-to-board characterization parameter | 133.9 | 99.8 | 245.6 | 169.4 | 384.1 | 306.0 | °C/W |
RθJC(bot) | Junction-to-case (bottom) thermal resistance | n/a | n/a | 195.4 | n/a | n/a | n/a | °C/W |
PARAMETER | TEST CONDITIONS | VCC | TA = 25°C | TA = –40°C to +85°C | UNIT | |||||
---|---|---|---|---|---|---|---|---|---|---|
MIN | TYP | MAX | MIN | MAX | ||||||
VOH | IOH = –20 µA | 0.8 V to 3.6 V | VCC – 0.1 | VCC – 0.1 | V | |||||
IOH = –1.1 mA | 1.1 V | 0.75 × VCC | 0.7 × VCC | |||||||
IOH = –1.7 mA | 1.4 V | 1.11 | 1.03 | |||||||
IOH = –1.9 mA | 1.65 V | 1.32 | 1.3 | |||||||
IOH = –2.3 mA | 2.3 V | 2.05 | 1.97 | |||||||
IOH = –3.1 mA | 1.9 | 1.85 | ||||||||
IOH = –2.7 mA | 3 V | 2.72 | 2.67 | |||||||
IOH = –4 mA | 2.6 | 2.55 | ||||||||
VOL | IOL = 20 µA | 0.8 V to 3.6 V | 0.1 | 0.1 | V | |||||
IOL = 1.1 mA | 1.1 V | 0.3 × VCC | 0.3 × VCC | |||||||
IOL = 1.7 mA | 1.4 V | 0.31 | 0.37 | |||||||
IOL = 1.9 mA | 1.65 V | 0.31 | 0.35 | |||||||
IOL = 2.3 mA | 2.3 V | 0.31 | 0.33 | |||||||
IOL = 3.1 mA | 0.44 | 0.45 | ||||||||
IOL = 2.7 mA | 3 V | 0.31 | 0.33 | |||||||
IOL = 4 mA | 0.44 | 0.45 | ||||||||
II | A or B input |
VI = GND to 3.6 V | 0 V to 3.6 V | 0.1 | 0.5 | µA | ||||
Ioff | VI or VO = 0 V to 3.6 V | 0 V | 0.2 | 0.6 | µA | |||||
ΔIoff | VI or VO = 0 V to 3.6 V | 0 V to 0.2 V | 0.2 | 0.6 | µA | |||||
ICC | VI = GND or (VCC to 3.6 V), IO = 0 |
0.8 V to 3.6 V | 0.5 | 0.9 | µA | |||||
ΔICC | VI = VCC – 0.6 V(1), IO = 0 | 3.3 V | 40 | 50 | µA | |||||
Ci | VI = VCC or GND | 0 V | 1.5 | pF | ||||||
3.6 V | 1.5 | |||||||||
Co | VO = GND | 0 V | 3 | pF |
PARAMETER | FROM (INPUT) |
TO (OUTPUT) |
VCC | TA = 25°C | TA = –40°C to +85°C | UNIT | |||
---|---|---|---|---|---|---|---|---|---|
MIN | TYP | MAX | MIN | MAX | |||||
tpd | A or B | Y | 0.8 V | 16.6 | ns | ||||
1.2 V ± 0.1 V | 2.6 | 7 | 13.8 | 2.1 | 17.1 | ||||
1.5 V ± 0.1 V | 2.9 | 5 | 9.2 | 2.9 | 11.1 | ||||
1.8 V ± 0.15 V | 2 | 4 | 7.1 | 2 | 9 | ||||
2.5 V ± 0.2 V | 1.3 | 2.9 | 4.9 | 1.3 | 6.2 | ||||
3.3 V ± 0.3 V | 1 | 2.4 | 3.8 | 1 | 4.8 |
PARAMETER | FROM (INPUT) |
TO (OUTPUT) |
VCC | TA = 25°C | TA = –40°C to +85°C | UNIT | |||
---|---|---|---|---|---|---|---|---|---|
MIN | TYP | MAX | MIN | MAX | |||||
tpd | A or B | Y | 0.8 V | 21.3 | ns | ||||
1.2 V ± 0.1 V | 3.6 | 9 | 17.3 | 3.1 | 21.5 | ||||
1.5 V ± 0.1 V | 2.9 | 6.5 | 11.6 | 2.9 | 14 | ||||
1.8 V ± 0.15 V | 2 | 5.3 | 9.2 | 2 | 11.4 | ||||
2.5 V ± 0.2 V | 1.3 | 3.9 | 6.4 | 1.3 | 8 | ||||
3.3 V ± 0.3 V | 1 | 3.3 | 5.1 | 1 | 6.4 |
PARAMETER | FROM (INPUT) |
TO (OUTPUT) |
VCC | TA = 25°C | TA = –40°C to +85°C | UNIT | |||
---|---|---|---|---|---|---|---|---|---|
MIN | TYP | MAX | MIN | MAX | |||||
tpd | A or B | Y | 0.8 V | 28.4 | ns | ||||
1.2 V ± 0.1 V | 4.9 | 11.9 | 21.9 | 4.4 | 27.1 | ||||
1.5 V ± 0.1 V | 2.9 | 8.6 | 14.7 | 2.9 | 17.7 | ||||
1.8 V ± 0.15 V | 2 | 7.1 | 11.5 | 2 | 14.2 | ||||
2.5 V ± 0.2 V | 1.3 | 5.3 | 8.1 | 1.3 | 10 | ||||
3.3 V ± 0.3 V | 1 | 4.5 | 6.5 | 1 | 8 |
PARAMETER | TEST CONDITIONS | VCC | TYP | UNIT | |
---|---|---|---|---|---|
Cpd | Power dissipation capacitance | f = 10 MHz | 0.8 V | 4 | pF |
1.2 V ± 0.1 V | 4 | ||||
1.5 V ± 0.1 V | 4 | ||||
1.8 V ± 0.15 V | 4 | ||||
2.5 V ± 0.2 V | 4 | ||||
3.3 V ± 0.3 V | 4 |
This is a single 2-input positive-NAND gate that is designed in Texas Instrument’s ultra-low power technology. It performs the Boolean function Y = A × B or Y = A + B in positive logic.
The AUP family of devices has quiescent power consumption less than 1 µA and comes in the ultra small DPW package. The DPW package technology is a major breakthrough in IC packaging. Its tiny 0.64 mm square footprint saves significant board space over other package options while still retaining the traditional manufacturing friendly lead pitch of 0.5 mm.
This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the device when it is powered. The Ioff feature also allows for live insertion.
Table 1 shows the functional modes of the SN74AUP1G00 device.
INPUTS | OUTPUT Y |
|
---|---|---|
A | B | |
L | L | H |
L | H | H |
H | L | H |
H | H | L |
The AUP family is TI's premier solution to the industry’s low-power needs in battery-powered portable applications. This family ensures a very low static and dynamic power consumption across the entire VCC range of 0.8 V to 3.6 V, resulting in an increased battery life. This product also maintains excellent signal integrity. It has a small amount of hysteresis built in allowing for slower or noisy input signals. The lowered drive produces slower edges and prevents overshoot and undershoot on the outputs.
This device uses CMOS technology and has balanced output drive. Take care to avoid bus contention because it can drive currents that would exceed maximum limits.
The AUP family of single gate logic makes excellent translators for the new lower voltage microprocessors that typically are powered from 0.8 V to 1.2 V. They can drop the voltage of peripheral drivers and accessories that are still powered by 3.3 V to the new uC power levels.
The power supply can be any voltage between the Min and Max supply voltage rating located in the Recommended Operating Conditions table.
Each VCC pin should have a good bypass capacitor to prevent power disturbance. For devices with a single supply, 0.1 μF is recommended; if there are multiple VCC pins, then 0.01 μF or 0.022 μF is recommended for each power pin. It is acceptable to parallel multiple bypass caps to reject different frequencies of noise. A 0.1 μF and a 1 μF are commonly used in parallel. The bypass capacitor should be installed as close to the power pin as possible for best results.
When using multiple-bit logic devices, inputs should never float.
In many cases, functions or parts of functions of digital logic devices are unused, for example, when only two inputs of a triple-input AND gate are used or only 3 of the 4 buffer gates are used. Such input pins should not be left unconnected because the undefined voltages at the outside connections result in undefined operational states. Figure 9 specifies the rules that must be observed under all circumstances. All unused inputs of digital logic devices must be connected to a high or low bias to prevent them from floating. The logic level that should be applied to any particular unused input depends on the function of the device. Generally they will be tied to GND or VCC, whichever makes more sense or is more convenient. It is generally acceptable to float outputs, unless the part is a transceiver. If the transceiver has an output enable pin, it will disable the output section of the part when asserted. This will not disable the input section of the I/Os, so they cannot float when disabled.
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These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates.
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