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Single-Event Effects Test Report of the TPS7H2201-SP
SLVAE32B
August 2018 – December 2023
TPS7H2201-SP
CONTENTS
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Single-Event Effects Test Report of the TPS7H2201-SP
1
Abstract
Trademarks
1
Device Overview
2
Single-Event Effects
3
Test Device and Evaluation Board Information
4
Depth, Range, and LETEFF Calculation
5
Irradiation Facility and Setup
6
Test Setup and Procedures
7
Single-Event-Latchup (SEL), Single-Event-Burnout (SEB), and Single-Event-Gate-Rupture (SEGR)
7.1
Single-Event-Latchup (SEL)
7.2
Single-Event-Burnout (SEB) and Single-Event-Gate-Rupture (SEGR)
8
Single Event Transient (SET)
9
Total Ionizing Dose From SEE Experiments
10
Orbital Environment Estimations
11
Confidence Interval Calculations
11.1
Rate Orbit Calculation
12
Summary
13
References
14
Revision History
IMPORTANT NOTICE
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Single-Event Effects Test Report of the TPS7H2201-SP