SN74AHCT00Q-Q1 Automotive Quadruple 2-Input Positive-NAND Gates

1 Features

AEC-Q100 qualified for automotive applications:
- Device temperature grade 1: -40°C to +125°C
- Device HBM ESD classification level 2
- Device CDM ESD classification level C4B
Available in wettable flank QFN (WBQA) package
Operating range of 4.5V to 5.5V
Low power consumption, 10µA maximum I_CC
±8mA output drive at 5V
Inputs are TTL-voltage compatible
Latch-up performance exceeds 250mA per JESD 17

2 Applications

3 Description

The SN74AHCT00Q-Q1 performs the Boolean function Y = A • B or Y = A + B in positive logic.

Package Information

PART NUMBER	PACKAGE⁽¹⁾	PACKAGE SIZE⁽²⁾	BODY SIZE⁽³⁾
SN74AHCT00Q-Q1	D (SOIC, 14)	8.65mm × 6mm	8.65mm × 3.90mm
	PW (TSSOP, 14)	5.00mm × 6.4mm	5.00mm × 4.40mm
	BQA (WQFN, 14)	3.00mm × 2.50mm	3.00mm × 2.50mm

(1) For more information, see Section 11.

(2) The package size (length × width) is a nominal value and includes pins, where applicable.

(3) The body size (length × width) is a nominal value and does not include pins.

Logic Symbol⁽¹⁾

Logic Diagram (Positive Logic)

†. This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.

4 Pin Configuration and Functions

Figure 4-1 BQA Package, 14-Pin WQFN (Top View)

Figure 4-2 D or PW Package, 14-Pin SOIC or TSSOP (Top View)

Table 4-1 Pin Functions

PIN		TYPE⁽¹⁾	DESCRIPTION
NAME	NO.	TYPE⁽¹⁾	DESCRIPTION
1A	1	I	Channel 1, Input A
1B	2	I	Channel 1, Input B
1Y	3	O	Channel 1, Output Y
2A	4	I	Channel 2, Input A
2B	5	I	Channel 2, Input B
2Y	6	O	Channel 2, Output Y
GND	7	—	Ground
3Y	8	O	Channel 3, Output Y
3A	9	I	Channel 3, Input A
3B	10	I	Channel 3, Input B
4Y	11	O	Channel 4, Output Y
4A	12	I	Channel 4, Input A
4B	13	I	Channel 4, Input B
V_CC	14	—	Positive Supply
Thermal Pad⁽²⁾		—	The thermal pad can be connected to GND or left floating. Do not connect to any other signal or supply.

(1) I = input, O = output, I/O = input or output, G = ground, P = power.

(2) BQA package only

5 Specifications

5.1 Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted)⁽¹⁾

		MIN	MAX	VALUE
V_CC	Supply voltage range	−0.5	7	V
V_I	Input voltage range⁽²⁾	−0.5	7	V
V_O	Output voltage range⁽²⁾	−0.5	V_CC + 0.5	V
I_IK (V_I < 0)	Input clamp current		−20	mA
I_OK (V_O < 0 or V_O > V_CC)	Output clamp current		±20	mA
I_O (V_O = 0 to V_CC)	Continuous output current		±25	mA
	Continuous current through V_CC or GND		±50	mA
T_stg	Storage temperature range	−65	150	°C

(1) Operation outside the Absolute Maximum Ratings may cause permanent device damage. Absolute maximum ratings do not imply functional operation of the device at these or any other conditions beyond those listed under Recommended Operating Conditions. If briefly operating outside the Recommended Operating Conditions but within the Absolute Maximum Ratings, the device may not sustain damage, but it may not be fully functional. Operating the device in this manner may affect device reliability, functionality, performance, and shorten the device lifetime.

(2) The input and output voltage ratings may be exceeded if the input and output current ratings are observed.

5.2 Recommended Operating Conditions

(over operating free-air temperature range (unless otherwise noted)⁽¹⁾

		MIN	MAX	UNIT
V_CC	Supply voltage	4.5	5.5	V
V_IH	High-level input voltage	2		V
V_IL	Low-level input voltage		0.8	V
V_I	Input voltage	0	5.5	V
V_O	Output voltage	0	V_CC	V
I_OH	High-level output current		−8	mA
I_OL	Low-level output current		8	mA
∆t/∆v	Input transition rise or fall rate		20	ns/V
T_A	Operating free-air temperature	−40	125	°C

(1) All unused inputs of the device must be held at V_CC or GND to ensure proper device operation. Refer to the TI application report, Implications of Slow or Floating CMOS Inputs.