SM320VC5416-EP

• Controlled Baseline
  • One Assembly/Test Site, One Fabrication Site
• Enhanced Diminishing Manufacturing Sources (DMS) Support
• Enhanced Product-Change Notification
• Qualification Pedigree
• Advanced Multibus Architecture With Three Separate 16-Bit Data Memory Buses and One Program Memory Bus
• 40-Bit Arithmetic Logic Unit (ALU) Including a 40-Bit Barrel Shifter and Two Independent 40-Bit Accumulators
• 17- × 17-Bit Parallel Multiplier Coupled to a 40-Bit Dedicated Adder for Non-Pipelined Single-Cycle Multiply/Accumulate (MAC) Operation
• Compare, Select, and Store Unit (CSSU) for the Add/Compare Selection of the Viterbi Operator
• Exponent Encoder to Compute an Exponent Value of a 40-Bit Accumulator Value in a Single Cycle
• Two Address Generators With Eight Auxiliary Registers and Two Auxiliary Register Arithmetic Units (ARAUs)
• Data Bus With a Bus Holder Feature
• Extended Addressing Mode for 8M × 16-Bit Maximum Addressable External Program Space
• 128K x 16-Bit On-Chip RAM Composed of:
  • Eight Blocks of 8K × 16-Bit On-Chip Dual-Access Program/Data RAM
  • Eight Blocks of 8K × 16-Bit On-Chip Single-Access Program RAM
• 16K × 16-Bit On-Chip ROM Configured for Program Memory
• Enhanced External Parallel Interface (XIO2)
• Single-Instruction-Repeat and Block-Repeat Operations for Program Code
• Block-Memory-Move Instructions for Better Program and Data Management
• Instructions With a 32-Bit Long Word Operand
• Instructions With Two- or Three-Operand Reads
• Arithmetic Instructions With Parallel Store and Parallel Load
• Conditional Store Instructions
• Fast Return From Interrupt
• On-Chip Peripherals
  • Software-Programmable Wait-State Generator and Programmable Bank-Switching
  • On-Chip Programmable Phase-Locked Loop (PLL) Clock Generator With External Clock Source
  • One 16-Bit Timer
  • Six-Channel Direct Memory Access (DMA) Controller
  • Three Multichannel Buffered Serial Ports (McBSPs)
  • 8/16-Bit Enhanced Parallel Host-Port Interface (HPI8/16)
• Power Consumption Control With IDLE1, IDLE2, and IDLE3 Instructions With Power-Down Modes
• CLKOUT Off Control to Disable CLKOUT
• On-Chip Scan-Based Emulation Logic, IEEE Std 1149.1 (JTAG) Boundary Scan Logic
• 144-Pin Ball Grid Array (BGA) (GGU Suffix)
• 144-Pin Low-Profile Quad Flatpack (LQFP) (PGE Suffix)
• 6.25-ns Single-Cycle Fixed-Point Instruction Execution Time (160 MIPS)
• 3.3-V I/O Supply Voltage
• 1.6-V Core Supply Voltage

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Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

IEEE Standard 1149.1-1990 Standard-Test-Access Port and Boundary Scan Architecture.
TMS320C54x and MicroStar BGA are trademarks of Texas Instruments.