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SN74LV2T74-Q1

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Automotive 1.8-V to 5.5-V single power supply dual D-Type positive-edge-triggered flip-flops

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Data sheet

SN74LV2T74-Q1

ACTIVE
Data sheet Order now

Product details

Technology family LV1T Number of channels 2 Vout (min) (V) 1.65 Vout (max) (V) 5.5 Data rate (max) (Mbps) 150 IOH (max) (mA) -8 IOL (max) (mA) 8 Supply current (max) (µA) 20 Features Balanced outputs, Over-voltage tolerant inputs, Voltage translation Input type Standard CMOS, TTL-Compatible CMOS Output type Push-Pull Operating temperature range (°C) -40 to 125
Technology family LV1T Number of channels 2 Vout (min) (V) 1.65 Vout (max) (V) 5.5 Data rate (max) (Mbps) 150 IOH (max) (mA) -8 IOL (max) (mA) 8 Supply current (max) (µA) 20 Features Balanced outputs, Over-voltage tolerant inputs, Voltage translation Input type Standard CMOS, TTL-Compatible CMOS Output type Push-Pull Operating temperature range (°C) -40 to 125
TSSOP (PW) 14 32 mm² 5 x 6.4 WQFN (BQA) 14 7.5 mm² 3 x 2.5

  • AEC-Q100 qualified for automotive applications:

    • Device temperature grade 1: -40°C to +125°C
    • Device HBM ESD classification level 2
    • Device CDM ESD classification level C4B

  • Available in wettable flank QFN (WBQA) package

  • Wide operating range of 1.8 V to 5.5 V

  • Single-supply voltage translator (refer to LVxT Enhanced Input Voltage):

    • Up translation:

      • 1.2 V to 1.8 V
      • 1.5 V to 2.5 V
      • 1.8 V to 3.3 V
      • 3.3 V to 5.0 V
    • Down translation:
      • 5.0 V, 3.3 V, 2.5 V to 1.8 V
      • 5.0 V, 3.3 V to 2.5 V
      • 5.0 V to 3.3 V
  • 5.5-V tolerant input pins
  • Supports standard pinouts
  • Up to 150 Mbps with 5-V or 3.3-V V CC
  • Latch-up performance exceeds 250 mA per JESD 17

  • AEC-Q100 qualified for automotive applications:

    • Device temperature grade 1: -40°C to +125°C
    • Device HBM ESD classification level 2
    • Device CDM ESD classification level C4B

  • Available in wettable flank QFN (WBQA) package

  • Wide operating range of 1.8 V to 5.5 V

  • Single-supply voltage translator (refer to LVxT Enhanced Input Voltage):

    • Up translation:

      • 1.2 V to 1.8 V
      • 1.5 V to 2.5 V
      • 1.8 V to 3.3 V
      • 3.3 V to 5.0 V
    • Down translation:
      • 5.0 V, 3.3 V, 2.5 V to 1.8 V
      • 5.0 V, 3.3 V to 2.5 V
      • 5.0 V to 3.3 V
  • 5.5-V tolerant input pins
  • Supports standard pinouts
  • Up to 150 Mbps with 5-V or 3.3-V V CC
  • Latch-up performance exceeds 250 mA per JESD 17

The SN74LV2T74-Q1 contains two independent D-type positive-edge-triggered flip-flops. A low level at the preset ( PRE) input sets the output high. A low level at the clear ( CLR) input resets the output low. Preset and clear functions are asynchronous and not dependent on the levels of the other inputs. When PRE and CLR are inactive (high), data at the data (D) input meeting the setup time requirements is transferred to the outputs (Q, Q) on the positive-going edge of the clock (CLK) pulse. Clock triggering occurs at a voltage level and is not directly related to the rise time of the input clock (CLK) signal. Following the hold-time interval, data at the data (D) input can be changed without affecting the levels at the outputs (Q, Q). The output level is referenced to the supply voltage (V CC) and supports 1.8-V, 2.5-V, 3.3-V, and 5-V CMOS levels.

The input is designed with a lower threshold circuit to support up translation for lower voltage CMOS inputs (for example, 1.2 V input to 1.8 V output or 1.8 V input to 3.3 V output). In addition, the 5-V tolerant input pins enable down translation (for example, 3.3 V to 2.5 V output).

The SN74LV2T74-Q1 contains two independent D-type positive-edge-triggered flip-flops. A low level at the preset ( PRE) input sets the output high. A low level at the clear ( CLR) input resets the output low. Preset and clear functions are asynchronous and not dependent on the levels of the other inputs. When PRE and CLR are inactive (high), data at the data (D) input meeting the setup time requirements is transferred to the outputs (Q, Q) on the positive-going edge of the clock (CLK) pulse. Clock triggering occurs at a voltage level and is not directly related to the rise time of the input clock (CLK) signal. Following the hold-time interval, data at the data (D) input can be changed without affecting the levels at the outputs (Q, Q). The output level is referenced to the supply voltage (V CC) and supports 1.8-V, 2.5-V, 3.3-V, and 5-V CMOS levels.

The input is designed with a lower threshold circuit to support up translation for lower voltage CMOS inputs (for example, 1.2 V input to 1.8 V output or 1.8 V input to 3.3 V output). In addition, the 5-V tolerant input pins enable down translation (for example, 3.3 V to 2.5 V output).
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* Data sheet SN74LV2T74-Q1 Automotive Dual D-Type Flip-Flop With Integrated Translation datasheet PDF | HTML 24 May 2023

Design & development

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Evaluation board

14-24-LOGIC-EVM — Logic product generic evaluation module for 14-pin to 24-pin D, DB, DGV, DW, DYY, NS and PW packages

The 14-24-LOGIC-EVM evaluation module (EVM) is designed to support any logic device that is in a 14-pin to 24-pin D, DW, DB, NS, PW, DYY or DGV package,

User guide: PDF | HTML
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Package Pins CAD symbols, footprints & 3D models
TSSOP (PW) 14 Ultra Librarian
WQFN (BQA) 14 Ultra Librarian
TI's Standard Terms and Conditions for Evaluation Items apply.

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