The TPS7H6013EVM-CVAL helps users evaluate the TPS7H6013-SP device. The board accepts up to a 45V input and allows users to test the reliability of the TPS7H6013-SP by driving a GaN FET. By default, the evaluation module is set up to run with the PWM mode of TPS7H6013-SP, which accepts an input of one switching signal and internally generates a complementary signal.
Features
- Selectable input interlock protection in independent input mode
- Split outputs for adjustable turn-on and turn-off times
- 25ns typical propagation delay in independent input mode
- 1.5A peak source current, 3A peak sink current
Half-bridge drivers
TPS7H6013-SP
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Radiation-hardened, QMLV 60-V half-bridge GaN gate driver