SFFS465 May   2022 TPS62901-Q1 , TPS62902-Q1 , TPS62903-Q1

 

  1. 1Overview
  2. 2Functional Safety Failure In Time (FIT) Rates
  3. 3Pin Failure Mode Analysis (Pin FMA)

1 Overview

This document contains information for the TPS629xx-Q1 (VQFN package) to aid in a functional safety system design. Information provided are:

  • Functional Safety Failure In Time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
  • Pin failure mode analysis (Pin FMA)

Figure 1-1 shows the device functional block diagram for reference.

GUID-3B574FA7-F8F8-4C51-ABEC-61624CDB1E1E-low.gif Figure 1-1 Functional Block Diagram

The TPS629xx-Q1 was developed using a quality-managed development process, but was not developed in accordance with the IEC 61508 or ISO 26262 standards.