SNVA955A January   2020  – September 2020 LMQ61460 , LMQ61460-Q1 , LMQ62440-Q1

 

  1. 1Overview
  2. 2Functional Safety Failure In Time (FIT) Rates
  3. 3Failure Mode Distribution (FMD)
  4. 4Pin Failure Mode Analysis (Pin FMA)
  5. 5Revision History

1 Overview

This document contains information for LMQ61460, LMQ61460-Q1, and LMQ62440-Q1 (VQFN-HR package) to aid in a functional safety system design. Information provided are:

  • Functional Safety Failure In Time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
  • Component failure modes and their distribution (FMD) based on the primary function of the device
  • Pin failure mode analysis (Pin FMA)

Figure 1-1 and Figure 1-2 show the device functional block diagrams for reference.

GUID-32AA3E61-D5FD-407E-814A-C3BDB6E4D5CA-low.gif Figure 1-1 Functional Block Diagram: LMQ61460, LMQ61460-Q1
GUID-20200904-CA0I-K7VW-L7VM-LLSLNL2ZRKWX-low.gif Figure 1-2 Functional Block Diagram: LMQ62440-Q1
LMQ61460, LMQ61460-Q1, and LMQ62440-Q1 were developed using a quality-managed development process, but were not developed in accordance with the IEC 61508 or ISO 26262 standards.