SLVK158A
November 2023 – June 2024
TPS7H6003-SP
,
TPS7H6013-SP
,
TPS7H6023-SP
PRODUCTION DATA
1
Abstract
Trademarks
1
Introduction
2
Single-Event Effects (SEE)
3
Device and Test Board Information
4
Irradiation Facility and Setup
5
Depth, Range, and LETEFF Calculation
6
Test Setup and Procedures
7
Destructive Single-Event Effects (DSEE)
7.1
Single-Event Latch-up (SEL) Results
7.2
Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results
8
Single-Event Transients (SET)
9
Event Rate Calculations
10
Summary
A References
B Revision History
Radiation Report
TPS7H60X3-SP Single-Event Effects (SEE) Report