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TPS7H6003-SP

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Radiation-hardened, QMLV 200-V half-bridge GaN gate driver

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Data sheet

TPS7H6003-SP

ACTIVE
Data sheet Order now

Product details

Bootstrap supply voltage (max) (V) 200 Power switch GaNFET Input supply voltage (min) (V) 10 Input supply voltage (max) (V) 16 Peak output current (A) 1.3 Operating temperature range (°C) -55 to 125 Undervoltage lockout (typ) (V) 8 Rating Catalog, Space Propagation delay time (µs) 0.035 Rise time (ns) 0.4 Fall time (ns) 4 Iq (mA) 0.5 Input threshold TTL Channel input logic TTL/PWM Features Dead time control, Interlock, Internal LDO Driver configuration Half bridge
Bootstrap supply voltage (max) (V) 200 Power switch GaNFET Input supply voltage (min) (V) 10 Input supply voltage (max) (V) 16 Peak output current (A) 1.3 Operating temperature range (°C) -55 to 125 Undervoltage lockout (typ) (V) 8 Rating Catalog, Space Propagation delay time (µs) 0.035 Rise time (ns) 0.4 Fall time (ns) 4 Iq (mA) 0.5 Input threshold TTL Channel input logic TTL/PWM Features Dead time control, Interlock, Internal LDO Driver configuration Half bridge
CFP (HBX) 48 141.9552 mm² 16.74 x 8.48
  • Radiation Performance:
    • Radiation-hardness-assurance (RHA) up to total ionizing dose (TID) of 100krad(Si)
    • Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune to linear energy transfer (LET) = 75MeV-cm2/mg
    • Single-event transient (SET) and single-event functional interrupt (SEFI) characterized up to LET = 75MeV-cm2/mg
  • 1.3A peak source, 2.5A peak sink current
  • Two operational modes:
    • Single PWM input with adjustable dead time
    • Two independent inputs
  • Selectable input interlock protection in independent input mode
  • Split outputs for adjustable turn-on and turn-off times
  • 30ns typical propagation delay in independent input mode
  • 5.5ns typical delay matching
  • Radiation Performance:
    • Radiation-hardness-assurance (RHA) up to total ionizing dose (TID) of 100krad(Si)
    • Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune to linear energy transfer (LET) = 75MeV-cm2/mg
    • Single-event transient (SET) and single-event functional interrupt (SEFI) characterized up to LET = 75MeV-cm2/mg
  • 1.3A peak source, 2.5A peak sink current
  • Two operational modes:
    • Single PWM input with adjustable dead time
    • Two independent inputs
  • Selectable input interlock protection in independent input mode
  • Split outputs for adjustable turn-on and turn-off times
  • 30ns typical propagation delay in independent input mode
  • 5.5ns typical delay matching

The TPS7H60x3-SP series of radiation-hardness-assured (RHA) gallium nitride (GaN) field effect transistor (FET) gate drivers is designed for high frequency, high efficiency applications. The series consists of the TPS7H6003-SP (200V rating), TPS7H6013-SP (60V rating), and the TPS7H6023-SP (22V rating). The drivers feature adjustable dead time capability, small 30ns propagation delay, and 5.5ns high-side and low-side matching. These parts also include internal high-side and low-side LDOs which ensure a drive voltage of 5V regardless of supply voltage. The TPS7H60x3-SP drivers all have split-gate outputs, providing flexibility to adjust the turn-on and turn-off strength of the outputs independently.

The TPS7H60x3-SP drivers feature two control input modes: independent input mode (IIM) and PWM mode. In IIM each of the outputs is controlled by a dedicated input. In PWM mode, two complementary outputs signals are generated from a single input and the user can adjust the dead time for each edge.

The gate drivers also offer user configurable input interlock in independent input mode as anti-shoot through protection. Input interlock disallows turn-on of both outputs when both inputs are on simultaneously. The user has the option to enable or disable this protection in independent input mode, which allows the driver to be used in a number of different converter configurations. The drivers can also be utilized for both half-bridge and dual-low side converter applications.

The TPS7H60x3-SP series of radiation-hardness-assured (RHA) gallium nitride (GaN) field effect transistor (FET) gate drivers is designed for high frequency, high efficiency applications. The series consists of the TPS7H6003-SP (200V rating), TPS7H6013-SP (60V rating), and the TPS7H6023-SP (22V rating). The drivers feature adjustable dead time capability, small 30ns propagation delay, and 5.5ns high-side and low-side matching. These parts also include internal high-side and low-side LDOs which ensure a drive voltage of 5V regardless of supply voltage. The TPS7H60x3-SP drivers all have split-gate outputs, providing flexibility to adjust the turn-on and turn-off strength of the outputs independently.

The TPS7H60x3-SP drivers feature two control input modes: independent input mode (IIM) and PWM mode. In IIM each of the outputs is controlled by a dedicated input. In PWM mode, two complementary outputs signals are generated from a single input and the user can adjust the dead time for each edge.

The gate drivers also offer user configurable input interlock in independent input mode as anti-shoot through protection. Input interlock disallows turn-on of both outputs when both inputs are on simultaneously. The user has the option to enable or disable this protection in independent input mode, which allows the driver to be used in a number of different converter configurations. The drivers can also be utilized for both half-bridge and dual-low side converter applications.
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Technical documentation

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Type Title Date
* Data sheet TPS7H60x3-SP Radiation-Hardness-Assured 1.3A, 2.5A, Half Bridge GaN FET Gate Drivers datasheet (Rev. C) PDF | HTML 17 Apr 2024
* Radiation & reliability report TPS7H60X3-SP Neutron Displacement Damage (NDD) Characterization Report (Rev. A) PDF | HTML 13 Aug 2024
* Radiation & reliability report TPS7H6003-SP Single-Event Effects (SEE) Report (Rev. A) PDF | HTML 17 Jun 2024
* SMD TPS7H6003-SP SMD 5962-22201 21 Dec 2023
* Radiation & reliability report TPS7H6003-SP Total Ionizing Dose (TID) Radiation Report PDF | HTML 30 Nov 2023
EVM User's guide TPS7H60x3EVM-CVAL and TPS7H60x5EVM Evaluation Module User's Guide (Rev. B) PDF | HTML 03 Jul 2024
Application brief DLA Approved Optimizations for QML Products (Rev. B) PDF | HTML 17 May 2024
Selection guide TI Space Products (Rev. J) 12 Feb 2024
Technical article How can you optimize SWaP for next-generation satellites with electronic power systems? PDF | HTML 02 Jan 2024
More literature TI Engineering Evaluation Units vs. MIL-PRF-38535 QML Class V Processing (Rev. A) 31 Aug 2023
Application note QML flow, its importance, and obtaining lot information (Rev. C) 30 Aug 2023
Certificate TPS7H6003EVM-CVAL EU Declaration of Conformity (DoC) 29 Jun 2023
Application note Heavy Ion Orbital Environment Single-Event Effects Estimations (Rev. A) PDF | HTML 17 Nov 2022
Application note Single-Event Effects Confidence Interval Calculations (Rev. A) PDF | HTML 19 Oct 2022
Application note DLA Standard Microcircuit Drawings (SMD) and JAN Part Numbers Primer 21 Aug 2020
Application note Hermetic Package Reflow Profiles, Termination Finishes, and Lead Trim and Form PDF | HTML 18 May 2020
E-book Radiation Handbook for Electronics (Rev. A) 21 May 2019

Design & development

For additional terms or required resources, click any title below to view the detail page where available.

Evaluation board

TPS7H6003EVM-CVAL — TPS7H6003 evaluation module for 200-V, 1.5-A and 3-A, GaN FET half-bridge driver

The TPS7H6003 evaluation module accepts up to a 150-V input and allows one to test the reliability of the TPS7H6003-SP by driving the EPC2307 part. By default the evaluation module is set-up to run in with the TPS7H6003-SP device in PWM mode which accepts an input of one switching signal and (...)

User guide: PDF | HTML
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Simulation model

TPS7H60x3-SP PSpice Transient Model

SNOM790.ZIP (46 KB) - PSpice Model
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Simulation model

TPS7H60x3-SP SIMPLIS Model

SNOM781.ZIP (22 KB) - SIMPLIS Model
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Simulation tool

PSPICE-FOR-TI — PSpice® for TI design and simulation tool

PSpice® for TI is a design and simulation environment that helps evaluate functionality of analog circuits. This full-featured, design and simulation suite uses an analog analysis engine from Cadence®. Available at no cost, PSpice for TI includes one of the largest model libraries in the (...)
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Reference designs

PMP23200 — 100W, 5V output hard-switched full-bridge converter reference design for 100kRad applications

This reference design uses the TPS7H5001-SP pulse-width modulation (PWM) controller and three TPS7H6003-SP half-bridge drivers to contruct a hard-switched full-bridge converter that takes an input ranging from 22V to 36V and generates an isolated 5V output capable of 100W loading. The controller, (...)
Test report: PDF
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CFP (HBX) 48 Ultra Librarian
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