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AFE11612-SEP

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Radiation-tolerant 12-bit analog front end with temperature sensors and 12 DAC and 16 ADC channels

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Data sheet

AFE11612-SEP

ACTIVE
Data sheet Order now

Product details

Number of ADC channels 16 ADC resolution (bps) 12 Number of DAC channels 12 DAC resolution (bps) 12 Temperature sensing Local, Remote Number of GPIOs 8 Interface type I2C, SPI Features GPIO Operating temperature range (°C) -55 to 125 Rating Space ADC sampling rate (ksps) 500 ADC analog input range (min) (V) -5 ADC analog input range (max) (V) 5 DAC settling time (µs) 2 DAC output full-scale (min) (V) 0 DAC output full-scale (max) (V) 12.5
Number of ADC channels 16 ADC resolution (bps) 12 Number of DAC channels 12 DAC resolution (bps) 12 Temperature sensing Local, Remote Number of GPIOs 8 Interface type I2C, SPI Features GPIO Operating temperature range (°C) -55 to 125 Rating Space ADC sampling rate (ksps) 500 ADC analog input range (min) (V) -5 ADC analog input range (max) (V) 5 DAC settling time (µs) 2 DAC output full-scale (min) (V) 0 DAC output full-scale (max) (V) 12.5
HTQFP (PAP) 64 144 mm² 12 x 12
  • Radiation tolerant:
    • Single-event latch-up (SEL) immune up to LET = 43 MeV-cm 2/mg at 125°C
    • Single-event functional interrupt (SEFI) characterized up to LET = 43 MeV-cm 2/mg
    • Total ionizing dose (TID) RLAT/RHA characterized up to 20 krad(Si)
  • Space-enhanced plastic (space EP):
    • Meets ASTM E595 outgassing specification
    • Vendor item drawing (VID) V62/22614
    • Military temperature range: –55°C to +125°C
    • One fabrication, assembly, and test site
    • Gold bond wire, NiPdAu lead finish
    • Wafer lot traceability
    • Extended product life cycle
  • 12 monotonic, 12-bit DACs
    • 0 V to 5 V output range
    • DAC shutdown to user-defined level
  • 16 input, 12-bit SAR ADC
    • High sample rate: 500 kSPS
    • 16 single-ended inputs or 2 differential and 12 single-ended inputs
    • Programmable out-of-range alarms
  • Eight GPIO pins
  • Internal 2.5-V reference
  • Two remote temperature sensors
  • Internal temperature sensor
  • Configurable SPI and I 2C interface
    • 2.7-V to 5.5-V operation
  • Radiation tolerant:
    • Single-event latch-up (SEL) immune up to LET = 43 MeV-cm 2/mg at 125°C
    • Single-event functional interrupt (SEFI) characterized up to LET = 43 MeV-cm 2/mg
    • Total ionizing dose (TID) RLAT/RHA characterized up to 20 krad(Si)
  • Space-enhanced plastic (space EP):
    • Meets ASTM E595 outgassing specification
    • Vendor item drawing (VID) V62/22614
    • Military temperature range: –55°C to +125°C
    • One fabrication, assembly, and test site
    • Gold bond wire, NiPdAu lead finish
    • Wafer lot traceability
    • Extended product life cycle
  • 12 monotonic, 12-bit DACs
    • 0 V to 5 V output range
    • DAC shutdown to user-defined level
  • 16 input, 12-bit SAR ADC
    • High sample rate: 500 kSPS
    • 16 single-ended inputs or 2 differential and 12 single-ended inputs
    • Programmable out-of-range alarms
  • Eight GPIO pins
  • Internal 2.5-V reference
  • Two remote temperature sensors
  • Internal temperature sensor
  • Configurable SPI and I 2C interface
    • 2.7-V to 5.5-V operation

The AFE11612-SEP is a highly integrated analog monitor and control device designed for high-density, general-purpose monitor and control systems. The device includes 12 12-bit digital-to-analog converters (DACs) and a 16-channel, 12-bit, analog-to-digital converter (ADC). The device also incorporates eight general-purpose inputs and outputs (GPIOs), two remote temperature sensor channels, and a local temperature sensor channel.

The device has an internal 2.5-V reference that sets the DAC to an output voltage range of 0 V to 5 V. The device also supports operation from an external reference. The device supports communication through both SPI-compatible and I 2C-compatible interfaces.

The device high level of integration significantly reduces component count and simplifies closed-loop system design, thus making the device a great choice for high-density applications where radiation-tolerance and board space are critical.

The AFE11612-SEP is a highly integrated analog monitor and control device designed for high-density, general-purpose monitor and control systems. The device includes 12 12-bit digital-to-analog converters (DACs) and a 16-channel, 12-bit, analog-to-digital converter (ADC). The device also incorporates eight general-purpose inputs and outputs (GPIOs), two remote temperature sensor channels, and a local temperature sensor channel.

The device has an internal 2.5-V reference that sets the DAC to an output voltage range of 0 V to 5 V. The device also supports operation from an external reference. The device supports communication through both SPI-compatible and I 2C-compatible interfaces.

The device high level of integration significantly reduces component count and simplifies closed-loop system design, thus making the device a great choice for high-density applications where radiation-tolerance and board space are critical.
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Technical documentation

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Type Title Date
* Data sheet AFE11612-SEP Radiation-Tolerant, Analog Monitor and Controller With Multichannel ADC, DACs, and Temperature Sensors datasheet (Rev. A) PDF | HTML 15 Sep 2023
* Radiation & reliability report AFE11612-SEP Single-Event Effects (SEE) Test Report (Rev. A) 01 Sep 2023
* Radiation & reliability report AFE11612-SEP Total Ionizing Dose (TID) Radiation Report (Rev. B) 26 Jan 2023
* Radiation & reliability report AFE11612-SEP Reliability and Production Flow Chart (Rev. A) PDF | HTML 23 Dec 2022
Product overview TI Space Qualified Temperature Sensor Product Selection Guide (Rev. A) PDF | HTML 22 Jan 2025
Application note Laser Biasing and Optical Communication Applications With the AFE11612-SEP (Rev. A) PDF | HTML 23 Jul 2024
EVM User's guide AFE11612 Evaluation Module User's Guide (Rev. A) PDF | HTML 03 Jun 2024
Certificate AFE11612EVM EU RoHS Declaration of Conformity (DoC) 01 Feb 2023

Design & development

For additional terms or required resources, click any title below to view the detail page where available.

Evaluation board

AFE11612EVM — AFE11612-SEP evaluation module for 12-bit analog front end (AFE) with temperature sensors

The AFE11612EVM is an easy-to-use platform that evaluates the functionality and performance of the AFE11612‑SEP device. The AFE11612‑SEP is a highly-integrated, low-power, complete analog monitor and controller that includes a 16-channel (12-bit) analog-to-digital converter (ADC), 12-channel (...)

User guide: PDF | HTML
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GUI for evaluation module (EVM)

AFE11612EVM-GUI — GUI for the AFE11612 evaluation module (EVM)

The AFE11612EVM-GUI is a windows-based software GUI that controls the AFE11612EVM through I2C and SPI.
Supported products & hardware

Supported products & hardware

Products
Integrated precision ADCs & DACs
AFE11612-SEP — Radiation-tolerant 12-bit analog front end with temperature sensors and 12 DAC and 16 ADC channels
Hardware development
Evaluation board
AFE11612EVM — AFE11612-SEP evaluation module for 12-bit analog front end (AFE) with temperature sensors
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Simulation tool

PSPICE-FOR-TI — PSpice® for TI design and simulation tool

PSpice® for TI is a design and simulation environment that helps evaluate functionality of analog circuits. This full-featured, design and simulation suite uses an analog analysis engine from Cadence®. Available at no cost, PSpice for TI includes one of the largest model libraries in the (...)
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HTQFP (PAP) 64 Ultra Librarian
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