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AFE3256

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256-channel analog front end (AFE) for dynamic and semi-dynamic X-ray flat-panel detectors

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Data sheet

AFE3256

ACTIVE
Data sheet Order now

Product details

Number of input channels 256 Resolution (Bits) 16 Features Internal Reference Buffer, Nap Mode, Power Down, X-ray Interface type SPI/LVDS Operating temperature range (°C) 0 to 70 Rating Catalog
Number of input channels 256 Resolution (Bits) 16 Features Internal Reference Buffer, Nap Mode, Power Down, X-ray Interface type SPI/LVDS Operating temperature range (°C) 0 to 70 Rating Catalog
COF (TFU) 320 1064 mm² 38 x 28 COF (TFV) 315 831.84 mm² 48 x 17.33
  • 256 channels
  • On-chip, 16-bit ADC
  • High performance:
    • Noise: 440 electrons RMS (1.2-pC input charge range)
    • Low correlated noise
    • Full-channel integral nonlinearity: ±2 LSB at 16 bit
    • Scan time: < 16 µs to 204.8 µs
  • Integration:
    • Programmable full-scale input charge range: 0.3pC to 12.5pC with resolution of 0.3pC
    • Internal timing generator (TG)
    • Built-in correlated double sampler
    • Software programmable electron or hole integration mode
    • Pipelined integrate-and-read for improved throughput—data-read during integration
    • Serial LVDS output
    • On-chip temperature sensor
  • Simple power supply scheme:
    • Single 1.85V power supply operation
  • Multiple power modes with power consumption ranging from 1mW/ch to 2mW/ch
  • Power-down modes: sleep and standby
  • Binning mode support
  • Custom chip-on-film (COF) packages
  • 256 channels
  • On-chip, 16-bit ADC
  • High performance:
    • Noise: 440 electrons RMS (1.2-pC input charge range)
    • Low correlated noise
    • Full-channel integral nonlinearity: ±2 LSB at 16 bit
    • Scan time: < 16 µs to 204.8 µs
  • Integration:
    • Programmable full-scale input charge range: 0.3pC to 12.5pC with resolution of 0.3pC
    • Internal timing generator (TG)
    • Built-in correlated double sampler
    • Software programmable electron or hole integration mode
    • Pipelined integrate-and-read for improved throughput—data-read during integration
    • Serial LVDS output
    • On-chip temperature sensor
  • Simple power supply scheme:
    • Single 1.85V power supply operation
  • Multiple power modes with power consumption ranging from 1mW/ch to 2mW/ch
  • Power-down modes: sleep and standby
  • Binning mode support
  • Custom chip-on-film (COF) packages

The AFE3256 is a 256-channel, analog front-end (AFE) designed to suit the requirements of flat-panel detector (FPD) based digital X-ray systems. The device includes 256 integrators, correlated double samplers (CDSs) with dual banking, and 256:2 analog multiplexers. The device also features two 16-bit successive-approximation register (SAR) analog-to-digital converters (ADCs). Serial data from the ADCs are available in low-voltage differential signaling (LVDS) format.

The device, also commonly referred to as a readout integrated circuit (ROIC), optimizes the overall system performance using features such as multiple power modes and in-system debug options.

The sleep and standby modes enable substantial power saving which is critical for battery-powered systems.

The AFE3256 is a 256-channel, analog front-end (AFE) designed to suit the requirements of flat-panel detector (FPD) based digital X-ray systems. The device includes 256 integrators, correlated double samplers (CDSs) with dual banking, and 256:2 analog multiplexers. The device also features two 16-bit successive-approximation register (SAR) analog-to-digital converters (ADCs). Serial data from the ADCs are available in low-voltage differential signaling (LVDS) format.

The device, also commonly referred to as a readout integrated circuit (ROIC), optimizes the overall system performance using features such as multiple power modes and in-system debug options.

The sleep and standby modes enable substantial power saving which is critical for battery-powered systems.
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Technical documentation

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Type Title Date
* Data sheet AFE3256 256-Channel, Analog Front-End for Digital X-Ray, Flat-Panel Detectors datasheet (Rev. A) PDF | HTML 24 Apr 2024
Certificate AFE3256EVM EU Declaration of Conformity (DoC) 18 Sep 2023
Analog Design Journal Selecting a multichannel ultra-low-current measurement IC PDF | HTML 18 Mar 2022

Design & development

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Evaluation board

AFE3256EVM — AFE3256 evaluation module for 256-channel analog front end (AFE) for X-ray flat-panel detectors

The AFE3256 evaluation module (EVM) is used to evaluate the AFE3256 device, a low-power, low-noise charge readout IC (charge to digital converter) in chip-on-flex (COF) package. The EVM comprises an analog board, which seamlessly integrates with the TSWDC155EVM (FPGA EVM) for data capture. The EVM (...)

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Driver or library

AFE3256-DESIGN — AFE3256 design files

AFE3256 datasheet, COF package drawings, EVM GUI/user guide and other design resources
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Digital X-ray AFEs
  • AFE3256 — 256-channel analog front end (AFE) for dynamic and semi-dynamic X-ray flat-panel detectors
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PSPICE-FOR-TI — PSpice® for TI design and simulation tool

PSpice® for TI is a design and simulation environment that helps evaluate functionality of analog circuits. This full-featured, design and simulation suite uses an analog analysis engine from Cadence®. Available at no cost, PSpice for TI includes one of the largest model libraries in the (...)
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COF (TFU) 320 Ultra Librarian
COF (TFV) 315 Ultra Librarian
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