The BQ77207 family of products
provides a range of voltage and temperature monitoring including overvoltage (OVP),
undervoltage (UVP), open wire (OW), and overtemperature (OT) protection for Li-ion battery pack
systems. Each cell is monitored independently for overvoltage, undervoltage, and
open-wire conditions. With the addition of an external NTC or PTC thermistor, the
device can detect overtemperature conditions.
In the BQ77207 device, an internal
delay timer is initiated upon detection of an overvoltage, undervoltage,
open-wire, or
overtemperature condition. Upon expiration of the delay timer, the respective output
is triggered into the active state (either high or low, depending on the
configuration).
The overvoltage triggers the COUT pin
if a fault is detected, and undervoltage triggers the DOUT pin if a fault is
detected. If an overtemperature or open-wire fault is detected, then both the DOUT and COUT is
triggered. For quicker production-line testing, the BQ77207 device provides a
Customer Test Mode (CTM) with greatly reduced delay time.
The BQ77207 family of products
provides a range of voltage and temperature monitoring including overvoltage (OVP),
undervoltage (UVP), open wire (OW), and overtemperature (OT) protection for Li-ion battery pack
systems. Each cell is monitored independently for overvoltage, undervoltage, and
open-wire conditions. With the addition of an external NTC or PTC thermistor, the
device can detect overtemperature conditions.
In the BQ77207 device, an internal
delay timer is initiated upon detection of an overvoltage, undervoltage,
open-wire, or
overtemperature condition. Upon expiration of the delay timer, the respective output
is triggered into the active state (either high or low, depending on the
configuration).
The overvoltage triggers the COUT pin
if a fault is detected, and undervoltage triggers the DOUT pin if a fault is
detected. If an overtemperature or open-wire fault is detected, then both the DOUT and COUT is
triggered. For quicker production-line testing, the BQ77207 device provides a
Customer Test Mode (CTM) with greatly reduced delay time.