The BQ77216xx family of products provides a range of voltage and temperature
monitoring, including overvoltage (OVP), undervoltage (UVP), open wire (OW), undertemperature (UT), and
overtemperature (OT) protection for Li-ion battery pack systems. Each cell is
monitored independently for overvoltage, undervoltage, and open-wire conditions.
With the addition of an external NTC thermistor, the device can detect
undertemperature and overtemperature conditions.
In the BQ77216xx device, an internal delay timer is initiated upon detection of
an overvoltage, undervoltage, open-wire,undertemperature, or overtemperature condition. Upon
expiration of the delay timer, the respective output is triggered into its active
state (either high or low, depending on the configuration).
Overvoltage triggers the COUT pin if a
fault is detected, and undervoltage triggers the DOUT pin if a fault is detected. If
an overtemperature or
open-wire fault is detected, then the DOUT and COUT are triggered. For quicker
production-line testing, the BQ77216xx device provides
a Customer Test Mode (CTM) with greatly reduced delay time.
The BQ77216xx family of products provides a range of voltage and temperature
monitoring, including overvoltage (OVP), undervoltage (UVP), open wire (OW), undertemperature (UT), and
overtemperature (OT) protection for Li-ion battery pack systems. Each cell is
monitored independently for overvoltage, undervoltage, and open-wire conditions.
With the addition of an external NTC thermistor, the device can detect
undertemperature and overtemperature conditions.
In the BQ77216xx device, an internal delay timer is initiated upon detection of
an overvoltage, undervoltage, open-wire,undertemperature, or overtemperature condition. Upon
expiration of the delay timer, the respective output is triggered into its active
state (either high or low, depending on the configuration).
Overvoltage triggers the COUT pin if a
fault is detected, and undervoltage triggers the DOUT pin if a fault is detected. If
an overtemperature or
open-wire fault is detected, then the DOUT and COUT are triggered. For quicker
production-line testing, the BQ77216xx device provides
a Customer Test Mode (CTM) with greatly reduced delay time.