VID V62/26601
Radiation - total ionizing dose (TID):
- TID characterized up to 50krad(Si)
- TID performance assurance up to 30krad(Si)
- Radiation Lot Acceptance Testing (RLAT) for every wafer lot up to 30krad(Si)
Radiation - single-event effects (SEE):
- Single event latch-up (SEL) immune up to 50MeV-cm2/mg at 125°C
- Single event transient (SET) characterized up to LET = 50MeV-cm2/mg
Wide operating range from 1.2V to 5.5V
5.5V tolerant input pins
Supports standard pinouts
Up to 150Mbps with 5V or 3.3V VCC
Latch-up performance exceeds 100mA per JESD 78
Space enhanced plastic:
- Supports Defense and Aerospace Applications
- Controlled baseline
- Au bond-wire and NiPdAu lead finish
- Meets NASA ASTM E595 out gassing specification
- One fabrication, assembly, and test site
- Extended product life cycle
- Product traceability

VID V62/26601
Radiation - total ionizing dose (TID):
- TID characterized up to 50krad(Si)
- TID performance assurance up to 30krad(Si)
- Radiation Lot Acceptance Testing (RLAT) for every wafer lot up to 30krad(Si)
Radiation - single-event effects (SEE):
- Single event latch-up (SEL) immune up to 50MeV-cm2/mg at 125°C
- Single event transient (SET) characterized up to LET = 50MeV-cm2/mg
Wide operating range from 1.2V to 5.5V
5.5V tolerant input pins
Supports standard pinouts
Up to 150Mbps with 5V or 3.3V VCC
Latch-up performance exceeds 100mA per JESD 78
Space enhanced plastic:
- Supports Defense and Aerospace Applications
- Controlled baseline
- Au bond-wire and NiPdAu lead finish
- Meets NASA ASTM E595 out gassing specification
- One fabrication, assembly, and test site
- Extended product life cycle
- Product traceability

The SN54SC1G08-SEP device is a single 2-input positive-AND gate. This device performs the Boolean function Y = A • B or Y = Ā + B̅ in positive logic.

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Top documentation	Type	Title	Format options	Date
*	Data sheet	SN54SC1G08-SEP Radiation Tolerant Single 2-Input Positive-AND Gate datasheet	PDF \| HTML	04 May 2026
*	Radiation & reliability report	SN54SC1G08-SEP Total Ionizing Dose (TID) Report		30 Apr 2026
*	Radiation & reliability report	SN54SC1G125-SEP Total Ionizing Dose (TID)		30 Apr 2026
*	Radiation & reliability report	SN54SC1G08-SEP Production Flow and Reliability Report	PDF \| HTML	01 Apr 2026
*	Radiation & reliability report	SN54SC1G08-SEP Single-Event Effects (SEE) Radiation Report	PDF \| HTML	30 Apr 2025

For additional terms or required resources, click any title below to view the detail page where available.

Evaluation board

Flexible EVM designed to support any device that has a DCK, DCT, DCU, DRL, or DBV package in a 5 to 8 pin count.

User guide: PDF

Not available on TI.com

Package	Pins	CAD symbols, footprints & 3D models
SOT-23 (DBV)	5	Ultra Librarian

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SN54SC1G08-SEP

Radiation-tolerant 1-ch, 2-input AND gate