TMS320C54V90

• Provides Two-Chip Modem Solution
• Data Rates from 300 bps to 56 Kbps
• Data Modulation Standards
     V.90, V.34, V.32bis, V.32, V.22bis, V.22, V.23,
     V.21 and V.23 reversible (Minitel), Bell 212, Bell 103
• FAX Capabilities
  • ITU-T V.17, V.29, V.27ter Modulations
  • TIA/EIA 578 Class 1 Interface
• V.42 or MNP Class 3 and 4 Error Control and V.42bis Compression
• Caller ID
• Field-Proven Modem Algorithms Give Highest Performance, Reliability, and Compatibility
• Non-Volatile EEPROM Configuration Storage
• Worldwide Telecom Approvals
• Parallel Phone Support Including Parallel Phone Detection
• Parallel Phone Exclusion Relay Control
• Protected Against Surge and Overvoltage on the Telephone Line
• Parallel Host Port Interface Supports a Variety of Industry Standard Busses
• Integral Serial Interface (UART)
• Autobaud on Serial DTE Interface
• State-of-the-Art Integrated Transformerless Silicon DAA for Phone Line Interconnection
• Applications
  • Embedded Systems
  • Set-Top Boxes
  • Gaming Consoles
  • Internet Appliances
  • Portable Devices (PDAs, digital cameras)
  • Remote Data Collection, Point-of-Sale
  • Meter Reading, Utility Monitoring
• 40K x 16-Bit Dual-Access On-Chip RAM
• 128K x 16-Bit On-Chip ROM
• On-Chip Peripherals
  • Software-Programmable Wait-State Generator and Programmable Bank Switching
  • On-Chip Phase-Locked Loop (PLL) Clock Generator With Internal Oscillator or External Clock Source
  • Two Multichannel Buffered Serial Ports (McBSPs)
  • Enhanced 8-Bit Parallel Host-Port Interface (HPI8)
• Power Consumption Control With IDLE1, IDLE2, and IDLE3 Instructions With Power-Down Modes
• On-Chip Scan-Based Emulation Logic, IEEE Std 1149.1 (JTAG) Boundary Scan Logic
• 8.5-ns Single-Cycle Fixed-Point Instruction Execution Time (117.96 MIPS) or 17-ns Instruction Execution Time (58.98 MIPS) for 3.3-V Power Supply (1.5-V Core)
• Available in a 144-Pin Plastic Low-Profile Quad Flatpack (LQFP) (PGE Suffix) and a 144-Pin Ball Grid Array (BGA) (GGU Suffix)

Note: Human Body Model ESD test performance for this product was demonstrated to be ±1.5 kV during product qualification. Industry standard test method used was IEA/JESD22-A114. Adherence to ESD handling precautionary procedures is advised at all times.
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IEEE Standard 1149.1-1990 Standard-Test-Access Port and Boundary Scan Architecture.