SN74ACT74-EP

Name: SN74ACT74-EP
Brand: TI
SKU: SN74ACT74-EP
Price: 1.037 USD

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具有清零和预置端的增强型产品双路正边沿触发式 D 型触发器

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数据表

document-pdfAcrobat SN74ACT74-EP 数据表 (英语)

SN74ACT74-EP

正在供货

数据表

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产品详情

Number of channels

2

Technology family

ACT

Supply voltage (min) (V)

4.5

Supply voltage (max) (V)

5.5

Input type

TTL-Compatible CMOS

Output type

Push-Pull

Clock frequency (max) (MHz)

90

IOL (max) (mA)

24

IOH (max) (mA)

-24

Supply current (max) (µA)

20

Features

Balanced outputs, Positive input clamp diode, Very high speed (tpd 5-10ns)

Operating temperature range (°C)

-55 to 125

Rating

HiRel Enhanced Product

Number of channels

2

Technology family

ACT

Supply voltage (min) (V)

4.5

Supply voltage (max) (V)

5.5

Input type

TTL-Compatible CMOS

Output type

Push-Pull

Clock frequency (max) (MHz)

90

IOL (max) (mA)

24

IOH (max) (mA)

-24

Supply current (max) (µA)

20

Features

Balanced outputs, Positive input clamp diode, Very high speed (tpd 5-10ns)

Operating temperature range (°C)

-55 to 125

Rating

HiRel Enhanced Product

SOIC (D)

14

51.9 mm² 8.65 x 6

Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
Extended Temperature Performance of –55°C to 125°C
Enhanced Diminishing Manufacturing Sources (DMS) Support
Enhanced Product-Change Notification
Qualification Pedigree
4.5-V to 5.5-V V_CC Operation
Inputs Accept Voltages to 5.5 V
Max t_pd of 10.5 ns at 5 V
Inputs Are TTL-Voltage Compatible

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
Extended Temperature Performance of –55°C to 125°C
Enhanced Diminishing Manufacturing Sources (DMS) Support
Enhanced Product-Change Notification
Qualification Pedigree
4.5-V to 5.5-V V_CC Operation
Inputs Accept Voltages to 5.5 V
Max t_pd of 10.5 ns at 5 V
Inputs Are TTL-Voltage Compatible

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

The SN74ACT74-EP is a dual positive-edge-triggered D-type flip-flop.

A low level at the preset (PRE\) or clear (CLR\) input sets or resets the outputs, regardless of the levels of the other inputs. When PRE\ and CLR\ are inactive (high), data at the data (D) input meeting the setup-time requirements is transferred to the outputs on the positive-going edge of the clock pulse. Clock triggering occurs at a voltage level and is not directly related to the rise time of the clock pulse. Following the hold-time interval, data at D can be changed without affecting the levels at the outputs.

The SN74ACT74-EP is a dual positive-edge-triggered D-type flip-flop.

A low level at the preset (PRE\) or clear (CLR\) input sets or resets the outputs, regardless of the levels of the other inputs. When PRE\ and CLR\ are inactive (high), data at the data (D) input meeting the setup-time requirements is transferred to the outputs on the positive-going edge of the clock pulse. Clock triggering occurs at a voltage level and is not directly related to the rise time of the clock pulse. Following the hold-time interval, data at D can be changed without affecting the levels at the outputs.

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