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DAC39RF10-SEP

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Radiation-tolerant, 30-krad, 16-bit, two-channel 10.4-GSPS, 12-GHz RF digital-to-analog converter

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Data sheet

DAC39RF10-SEP

ACTIVE
Data sheet Order now

Product details

Resolution (Bits) 16 Number of DAC channels 2 Interface type JESD204B, JESD204C Sample/update rate (Msps) 10400, 20800 Features Ultra High Speed Rating Space Interpolation 128x, 12x, 16x, 192x, 1x, 24x, 256x, 2x, 32x, 3x, 48x, 4x, 64x, 6x, 8x, 96x Power consumption (typ) (mW) 3800 SFDR (dB) 85 Architecture Current Source Operating temperature range (°C) -55 to 125 Reference type Ext, Int
Resolution (Bits) 16 Number of DAC channels 2 Interface type JESD204B, JESD204C Sample/update rate (Msps) 10400, 20800 Features Ultra High Speed Rating Space Interpolation 128x, 12x, 16x, 192x, 1x, 24x, 256x, 2x, 32x, 3x, 48x, 4x, 64x, 6x, 8x, 96x Power consumption (typ) (mW) 3800 SFDR (dB) 85 Architecture Current Source Operating temperature range (°C) -55 to 125 Reference type Ext, Int
FCBGA (ACL) 256 289 mm² 17 x 17
  • Radiation hardness assured DAC39RFx10-SP:
    • Single event upset (SEU) immune registers
    • Single-event latch up (SEL): 120MeV-cm2/mg
    • RLAT Total ionizing dose (TID): 300krad (Si)
  • Radiation tolerant DAC39RFx10-SEP:
    • Single event upset (SEU) immune registers
    • Single-event latch up (SEL): 43MeV-cm2/mg
    • RLAT Total ionizing dose (TID): 30krad (Si)
  • 16-bit, 10.4 or 20.8GSPS, multi-Nyquist DAC Cores
  • Maximum input data rate:
    • 8-bit, Single channel, DES mode: 20.8GSPS
    • 12-bit, Single channel, DES mode: 15.5GSPS
    • 16-bit, Single channel: 10.4GSPS
    • 8-bit, Dual channel, 10.4GSPS
    • 12-bit, Dual channel: 7.75GSPS/ch
    • 16-bit, Dual channel: 6.2GSPS/ch
  • Output bandwidth (-3dB): 12GHz
  • Performance at fOUT = 2.997GHz, DES2XL mode, DEM/Dither off
    • Noise floor (small signal): –155dBFS/Hz
    • SFDR (-0.1dBFS) : 60dBc
    • IMD3 (-7dBFS each tone) : –62dBc
    • Additive phase noise, 10kHz offset: -138dBc/Hz
  • Four Integrated digital up-converters (DUC)
    • Interpolation: 1x, 2x, 3x, 4x, 6x, 8x, 12x ... 256x
    • Complex baseband DUC for I/Q output
    • Complex to real up conversion for dual channel direct RF sampling
    • 64-bit frequency resolution NCOs
  • JESD204C Interface
    • Up to 16 Lanes at up to 12.8Gbps
    • Class C-S, subclass-1 Compatible
    • Internal AC coupling capacitors
  • SYSREF Windowing for automatic SYSREF timing calibration
  • Space screening and assurance:
    • Meets ASTM E595 outgassing specification
    • One fabrication, assembly, and test site
    • Wafer lot traceability
    • Extended product life cycle
    • Radiation lot acceptance test (RLAT)
    • Production burn-in (DAC39RFx10-SP only)
  • Radiation hardness assured DAC39RFx10-SP:
    • Single event upset (SEU) immune registers
    • Single-event latch up (SEL): 120MeV-cm2/mg
    • RLAT Total ionizing dose (TID): 300krad (Si)
  • Radiation tolerant DAC39RFx10-SEP:
    • Single event upset (SEU) immune registers
    • Single-event latch up (SEL): 43MeV-cm2/mg
    • RLAT Total ionizing dose (TID): 30krad (Si)
  • 16-bit, 10.4 or 20.8GSPS, multi-Nyquist DAC Cores
  • Maximum input data rate:
    • 8-bit, Single channel, DES mode: 20.8GSPS
    • 12-bit, Single channel, DES mode: 15.5GSPS
    • 16-bit, Single channel: 10.4GSPS
    • 8-bit, Dual channel, 10.4GSPS
    • 12-bit, Dual channel: 7.75GSPS/ch
    • 16-bit, Dual channel: 6.2GSPS/ch
  • Output bandwidth (-3dB): 12GHz
  • Performance at fOUT = 2.997GHz, DES2XL mode, DEM/Dither off
    • Noise floor (small signal): –155dBFS/Hz
    • SFDR (-0.1dBFS) : 60dBc
    • IMD3 (-7dBFS each tone) : –62dBc
    • Additive phase noise, 10kHz offset: -138dBc/Hz
  • Four Integrated digital up-converters (DUC)
    • Interpolation: 1x, 2x, 3x, 4x, 6x, 8x, 12x ... 256x
    • Complex baseband DUC for I/Q output
    • Complex to real up conversion for dual channel direct RF sampling
    • 64-bit frequency resolution NCOs
  • JESD204C Interface
    • Up to 16 Lanes at up to 12.8Gbps
    • Class C-S, subclass-1 Compatible
    • Internal AC coupling capacitors
  • SYSREF Windowing for automatic SYSREF timing calibration
  • Space screening and assurance:
    • Meets ASTM E595 outgassing specification
    • One fabrication, assembly, and test site
    • Wafer lot traceability
    • Extended product life cycle
    • Radiation lot acceptance test (RLAT)
    • Production burn-in (DAC39RFx10-SP only)

The DAC39RF10-Sx and ’RFS10-Sx are a family of dual and single channel digital-to-analog converters (DAC) with 16-bit resolution. The devices can be used as non-interpolating or interpolating DACs for either direct RF sampling or complex baseband signal generation. The maximum input data rate is 20.8GSPS for a single channel or 10.4 GSPS for two channels. The devices can generate signals of up to 10, 7.5, and 5GHz signal bandwidth (8, 12, and 16-bit input resolution) at carrier frequencies exceeding 10GHz enabling direct sampling in X-band.

The high sampling rate, output frequency range, 64-bit NCO frequency resolution and any frequency hopping with phase coherence also makes the DAC39RF10-Sx and ’RFS10-Sx capable of arbitrary waveform generation (AWG) and direct digital synthesis (DDS).

A JESD204B and JESD204C compatible serial interface has 16 receiver pairs capable of up to 12.8Gbps. The interface is JESD204B and JESD204C subclass-1 compliant for deterministic latency and multi-device synchronization through the use of SYSREF.

The DAC39RF10-Sx and ’RFS10-Sx are a family of dual and single channel digital-to-analog converters (DAC) with 16-bit resolution. The devices can be used as non-interpolating or interpolating DACs for either direct RF sampling or complex baseband signal generation. The maximum input data rate is 20.8GSPS for a single channel or 10.4 GSPS for two channels. The devices can generate signals of up to 10, 7.5, and 5GHz signal bandwidth (8, 12, and 16-bit input resolution) at carrier frequencies exceeding 10GHz enabling direct sampling in X-band.

The high sampling rate, output frequency range, 64-bit NCO frequency resolution and any frequency hopping with phase coherence also makes the DAC39RF10-Sx and ’RFS10-Sx capable of arbitrary waveform generation (AWG) and direct digital synthesis (DDS).

A JESD204B and JESD204C compatible serial interface has 16 receiver pairs capable of up to 12.8Gbps. The interface is JESD204B and JESD204C subclass-1 compliant for deterministic latency and multi-device synchronization through the use of SYSREF.
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* Data sheet DAC39RFx10-SP DAC39RFx10-SEP 10.4 or 20.8GSPS, 16-bit, Dual and Single Channel, Multi-Nyquist Digital-to-Analog Converter (DAC) with JESD204C Interface datasheet PDF | HTML 25 Mar 2024

Design & development

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Evaluation board

DAC39RF10EVM — DAC39RF10 evaluation module

The DAC39RF10EVM is an evaluation board used to evaluate the DAC39RF10, digital-to-analog converter (DAC) from Texas Instruments.

User guide: PDF | HTML
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PSPICE-FOR-TI — PSpice® for TI design and simulation tool

PSpice® for TI is a design and simulation environment that helps evaluate functionality of analog circuits. This full-featured, design and simulation suite uses an analog analysis engine from Cadence®. Available at no cost, PSpice for TI includes one of the largest model libraries in the (...)
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Reference designs

TIDA-010274 — Space-grade discrete RF sampling transceiver reference design

This reference design incorporates a 10 GSPS dual digital-to-analog converter and a 5 GSPS dual analog-to-digital converter with active baluns on the RF interface supporting up through X-band. The design also incorporates a space-grade clocking daughter card and a space-grade power solution (...)
Design guide: PDF
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FCBGA (ACL) 256 Ultra Librarian
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