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SN74S140

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2 通道、4 输入、4.75V 至 5.25V 双极与非门

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数据表

SN74S140

正在供货
数据表 立即订购

产品详情

Technology family S Supply voltage (min) (V) 4.75 Supply voltage (max) (V) 5.25 Number of channels 2 Inputs per channel 4 IOL (max) (mA) 60 IOH (max) (mA) -40 Input type Bipolar Output type Push-Pull Features Very high speed (tpd 5-10ns) Data rate (max) (Mbps) 50 Rating Catalog Operating temperature range (°C) 0 to 70
Technology family S Supply voltage (min) (V) 4.75 Supply voltage (max) (V) 5.25 Number of channels 2 Inputs per channel 4 IOL (max) (mA) 60 IOH (max) (mA) -40 Input type Bipolar Output type Push-Pull Features Very high speed (tpd 5-10ns) Data rate (max) (Mbps) 50 Rating Catalog Operating temperature range (°C) 0 to 70
PDIP (N) 14 181.42 mm² 19.3 x 9.4 SOIC (D) 14 51.9 mm² 8.65 x 6
  • Package Options Include Ceramic Chip Carriers and Flat Packages in Addition to Plastic and Ceramic DIPs
  • Dependable Texas Instruments Quality and Reliability

 
  • Package Options Include Ceramic Chip Carriers and Flat Packages in Addition to Plastic and Ceramic DIPs
  • Dependable Texas Instruments Quality and Reliability

 

These devices contain two independent 4-input positive-NAND 50-ohm line drivers. They perform the Boolean function Y = ABCD\.

The SN54S140 is characterized for operation over the full military temperature range of -55°C to 125°C. The SN74S140 is characterized for operation from 0°C to 70°C.

 

These devices contain two independent 4-input positive-NAND 50-ohm line drivers. They perform the Boolean function Y = ABCD\.

The SN54S140 is characterized for operation over the full military temperature range of -55°C to 125°C. The SN74S140 is characterized for operation from 0°C to 70°C.

 
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SN74ACT00 正在供货 具有 TTL 兼容型 CMOS 输入的 4 通道、2 输入、4.5V 至 5.5V 与非门 Voltage range (4.5V to 5.5V), average drive strength (24mA), average propagation delay (8ns)

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类型 标题 下载最新的英语版本 日期
* 数据表 Dual 4-Input Positive-NAND 50-Ohm Line Drivers 数据表 1988年 3月 1日

订购和质量

包含信息：
  • RoHS
  • REACH
  • 器件标识
  • 引脚镀层/焊球材料
  • MSL 等级/回流焊峰值温度
  • MTBF/时基故障估算
  • 材料成分
  • 鉴定摘要
  • 持续可靠性监测
包含信息：
  • 制造厂地点
  • 封装厂地点

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