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数字多路信号分离器和解码器

CD4511B-MIL

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CMOS BCD 到 7 段 LED 锁存解码驱动器

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数据表

CD4511B-MIL

正在供货
数据表 立即订购

产品详情

Technology family CD4000 Number of channels 1 Operating temperature range (°C) -55 to 125 Rating Military Supply current (max) (µA) 3000
Technology family CD4000 Number of channels 1 Operating temperature range (°C) -55 to 125 Rating Military Supply current (max) (µA) 3000
CDIP (J) 16 135.3552 mm² 19.56 x 6.92
  • High-output-sourcing capability............up to 25 mA
  • Input latches for BCD Code storage
  • Lamp Test and Blanking capability
  • 7-segment outputs blanked for BCD input codes > 1001
  • 100% tested for quiescent current at 20 V
  • Max. input current of 1 µA at 18 V, over full package-temperature range, 100 nA at 18 V and 25°C
  • 5-V, 10-V, and 15-V parametric ratings
  • Applications
    • Driving common-cathode LED displays
    • Multiplexing with common-cathode LED displays
    • Driving incandescent displays
    • Driving low-voltage fluorescent displays
  • High-output-sourcing capability............up to 25 mA
  • Input latches for BCD Code storage
  • Lamp Test and Blanking capability
  • 7-segment outputs blanked for BCD input codes > 1001
  • 100% tested for quiescent current at 20 V
  • Max. input current of 1 µA at 18 V, over full package-temperature range, 100 nA at 18 V and 25°C
  • 5-V, 10-V, and 15-V parametric ratings
  • Applications
    • Driving common-cathode LED displays
    • Multiplexing with common-cathode LED displays
    • Driving incandescent displays
    • Driving low-voltage fluorescent displays

CD4511B types are BCD-to-7-segment latch decoder drivers constructed with CMOS logic and n-p-n bipolar transistor output devices on a single monolithic structure. These devices combine the low quiescent power dissipation and high noise immunity features of RCA CMOS with n-p-n bipolar output transistors capable of sourcing up to 25 MA. This capability allows the CD4511B types to drive LED's and other displays directly.

Lamp Test (LT)\, Blanking (BL)\, and Latch Enable or Strobe inputs are provided to test the display, shut off or intensity-modulate it, and store or strobe a BCD code, respectively. Several different signals may be multiplexed and displayed when external multiplexing circuitry is used.

The CD4511B types are supplied in 16-lead hermetic dual-in-line ceramic packages (F3A suffix), 16-lead dual-in-line plastic packages (E suffix), 16-lead small-outline packages (NSR suffix), and 16-lead thin shrink small-outline packages (PW and PWR suffixes).

These devices are similar to the type MC14511.

CD4511B types are BCD-to-7-segment latch decoder drivers constructed with CMOS logic and n-p-n bipolar transistor output devices on a single monolithic structure. These devices combine the low quiescent power dissipation and high noise immunity features of RCA CMOS with n-p-n bipolar output transistors capable of sourcing up to 25 MA. This capability allows the CD4511B types to drive LED's and other displays directly.

Lamp Test (LT)\, Blanking (BL)\, and Latch Enable or Strobe inputs are provided to test the display, shut off or intensity-modulate it, and store or strobe a BCD code, respectively. Several different signals may be multiplexed and displayed when external multiplexing circuitry is used.

The CD4511B types are supplied in 16-lead hermetic dual-in-line ceramic packages (F3A suffix), 16-lead dual-in-line plastic packages (E suffix), 16-lead small-outline packages (NSR suffix), and 16-lead thin shrink small-outline packages (PW and PWR suffixes).

These devices are similar to the type MC14511.
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类型 标题 下载最新的英语版本 日期
* 数据表 CMOS BCD-to-7-Segment Latch Decoder Drivers 数据表 (Rev. B) 2003年 6月 27日

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包含信息：
  • RoHS
  • REACH
  • 器件标识
  • 引脚镀层/焊球材料
  • MSL 等级/回流焊峰值温度
  • MTBF/时基故障估算
  • 材料成分
  • 鉴定摘要
  • 持续可靠性监测
包含信息：
  • 制造厂地点
  • 封装厂地点

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