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SN55LVRA4-SEP

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Quad channel high-speed differential receiver

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SN55LVRA4-SEP

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Product details

Function Receiver Protocols LVDS Number of transmitters 0 Number of receivers 4 Supply voltage (V) 3.3 Signaling rate (Mbps) 400 Input signal CMOS, ECL, LVCMOS, LVDS, LVECL, LVPECL, PECL Output signal LVTTL Rating Space Operating temperature range (°C) -55 to 125
Function Receiver Protocols LVDS Number of transmitters 0 Number of receivers 4 Supply voltage (V) 3.3 Signaling rate (Mbps) 400 Input signal CMOS, ECL, LVCMOS, LVDS, LVECL, LVPECL, PECL Output signal LVTTL Rating Space Operating temperature range (°C) -55 to 125
SOIC (D) 16 59.4 mm² 9.9 x 6
  • Vendor item drawing available
  • Total ionizing dose characterized at 30krad (Si)
    • Total ionizing dose radiation lot acceptance testing (TID RLAT) for every wafer lot to 30krad (Si)
  • Single-event effects (SEE) characterized:
    • Single event latch-up (SEL) immune to linear energy transfer (LET) = 43MeV-cm2 /mg
    • Single event transient (SET) characterized to 43MeV-cm2 /mg.
  • 400Mbps signaling rate
  • Operates with a single 3.3V supply
  • –4V to 5V extended common-mode input voltage range
  • Differential input thresholds < ±50mV with 50mV of hysteresis over entire common-mode input voltage range
  • Complies with TIA/EIA-644 (LVDS)
  • Active failsafe assures a high-level output with no input and input remains high-impedance on power down
  • Bus-pin ESD protection exceeds 15kV HBM
  • TTL control inputs are 5V tolerant
  • Space enhanced plastic (SEP)
    • Controlled baseline
    • Gold wire, NiPdAu lead finish
    • One assembly and test site, one fabrication site
    • Extended product life cycle
    • Military (–55°C to 125°C) temperature range
    • Product traceability
    • Meets NASA ASTM E595 outgassing specification
  • Vendor item drawing available
  • Total ionizing dose characterized at 30krad (Si)
    • Total ionizing dose radiation lot acceptance testing (TID RLAT) for every wafer lot to 30krad (Si)
  • Single-event effects (SEE) characterized:
    • Single event latch-up (SEL) immune to linear energy transfer (LET) = 43MeV-cm2 /mg
    • Single event transient (SET) characterized to 43MeV-cm2 /mg.
  • 400Mbps signaling rate
  • Operates with a single 3.3V supply
  • –4V to 5V extended common-mode input voltage range
  • Differential input thresholds < ±50mV with 50mV of hysteresis over entire common-mode input voltage range
  • Complies with TIA/EIA-644 (LVDS)
  • Active failsafe assures a high-level output with no input and input remains high-impedance on power down
  • Bus-pin ESD protection exceeds 15kV HBM
  • TTL control inputs are 5V tolerant
  • Space enhanced plastic (SEP)
    • Controlled baseline
    • Gold wire, NiPdAu lead finish
    • One assembly and test site, one fabrication site
    • Extended product life cycle
    • Military (–55°C to 125°C) temperature range
    • Product traceability
    • Meets NASA ASTM E595 outgassing specification

The SN55LVRA4-SEP offers the widest common-mode input voltage range in the industry. These receivers provide an input voltage range specification compatible with a 5V PECL signal as well as an overall increased ground-noise tolerance.

The SN55LVRA4-SEP include a failsafe circuit that provides a high-level output within 60ns after loss of the input signal. The most common causes of signal loss are disconnected cables, shorted lines, or powered-down transmitters. The failsafe circuit prevents noise from being received as valid data under these fault conditions.

The intended application and signaling technique of these devices is point-to-point baseband data transmission over controlled impedance media of approximately 100Ω. The transmission media can be printed-circuit board traces, backplanes, or cables. The ultimate rate and distance of data transfer is dependent upon the attenuation characteristics of the media and the noise coupling to the environment.

The SN55LVRA4-SEP is characterized for operation from –55°C to 125°C.

The SN55LVRA4-SEP offers the widest common-mode input voltage range in the industry. These receivers provide an input voltage range specification compatible with a 5V PECL signal as well as an overall increased ground-noise tolerance.

The SN55LVRA4-SEP include a failsafe circuit that provides a high-level output within 60ns after loss of the input signal. The most common causes of signal loss are disconnected cables, shorted lines, or powered-down transmitters. The failsafe circuit prevents noise from being received as valid data under these fault conditions.

The intended application and signaling technique of these devices is point-to-point baseband data transmission over controlled impedance media of approximately 100Ω. The transmission media can be printed-circuit board traces, backplanes, or cables. The ultimate rate and distance of data transfer is dependent upon the attenuation characteristics of the media and the noise coupling to the environment.

The SN55LVRA4-SEP is characterized for operation from –55°C to 125°C.

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Technical documentation

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* Data sheet SN55LVRA4-SEP Quad Channel High-Speed Differential Receiver datasheet PDF | HTML 06 Feb 2025
Selection guide TI Space Products (Rev. K) 04 Apr 2025

Design & development

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Evaluation board

SN65LVDS31-33EVM — Evaluation Module for SN65LVDS31 and SN65LVDS33

TI offers a series of low-voltage differential signaling (LVDS) evaluation modules (EVMs) designed for analysis of the electrical characteristics of LVDS drivers and receivers. Four unique EVMs are available to evaluate the different classes of LVDS devices offered by TI.

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Simulation model

SN65LVDS33 IBIS Model (Rev. A)

SLLC069A.ZIP (6 KB) - IBIS Model
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PSpice® for TI is a design and simulation environment that helps evaluate functionality of analog circuits. This full-featured, design and simulation suite uses an analog analysis engine from Cadence®. Available at no cost, PSpice for TI includes one of the largest model libraries in the (...)
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TINA-TI — SPICE-based analog simulation program

TINA-TI provides all the conventional DC, transient and frequency domain analysis of SPICE and much more. TINA has extensive post-processing capability that allows you to format results the way you want them. Virtual instruments allow you to select input waveforms and probe circuit nodes voltages (...)
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